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Field emission transmission electron microscope HF-3300
Hitachi's renowned cold field emission electron source and 300 kV acceleration voltage technology jointly create ultra-high resolution imaging and hig
Product details
Field emission transmission electron microscope HF-3300
Hitachi's renowned cold field emission electron source and 300 kV acceleration voltage technology jointly create ultra-high resolution imaging and high-sensitivity analysis functions. Double prism holography technology, spatially resolved electron energy loss spectroscopy, and high-precision parallel nano electron beam diffraction technology have opened up new avenues for efficient and high-precision sample analysis.
characteristic
resolution
0.1 nm (crystal lattice)
0.19 nm (point-to-point)
0.13 nm (information limit)
magnification
200 times to 1500000 times
Accelerating Voltage
300 kV, 200 kV*, 100 kV*
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Related product classification
- Focused Ion Beam
- Pre treatment device for TEM/SEM samples
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